Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Business Wire

Keysight Introduces Comprehensive LPDDR6 Solution for End-to-End Memory Design and Test Workflows

Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...
EDN

Viewpoint: An Evolution in Design for Test

Designers relate to Design for Test (DFT) in much the way that small children relate to scary programs on TV: if they cover their eyes with their hands, perhaps it will go away. But every designer ...
Semiconductor Engineering

Challenges And Outlook Of ATE Testing For 2nm SoCs

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...