Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...

Deep submicron technology enabled the design of the industry's first very large chips. The magnitude of the design effort involved in creating these chips led to the adoption of reuse methodologies ...

Testing, alone, cannot find all potential failure points for real-time embedded software, particularly in multithreading environments. In part 2 of Sean Beatty's article on errors that escape ...

A new class of IP is emerging to address many of the challenges in manufacturing today�s complex SOC devices. Every new generation of semiconductor technology delivers the advantage of higher levels ...