AZoNano

Combining Flexibility and Automation in FIB-SEM for TEM Lamella Preparation

FIB-SEM enables precise, automated TEM lamella prep with expert insights from Zeiss and the Polish Academy of Sciences.
AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
AZOM

Lithium-Ion Battery Component Characterization via SEM, EDS and ToF-SIMS in FIB-SEM Tomography

A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
Nature

Ultrastructurally smooth thick partitioning and volume stitching for large-scale connectomics

Today's scanning electron microscopes achieve ∼2-nm spot diameters at landing energies low enough that only the top few nanometers of the block's surface contributes substantially to the acquired ...
Michigan Technological University

Hitachi FB-2000A FIB

The Hitachi FB-2000A FIB uses a beam of focused high-energy (30 kV) gallium ions to remove material in a very controlled manner from inorganic specimens. The FB-2000A is a single beam system; that is, ...