The automatic detection of surface-level irregularities—defects or anomalies—in 3D data is of significant interest for ...

When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

The automatic detection of surface-level irregularities—defects or anomalies—in 3D data is of significant interest for various real-world purposes ...

The Korea Research Institute of Standards and Science (KRISS, President Lee Ho-seong) has developed an ultrasonic sensor technology that applies a waveguide to detect defects in all directions without ...

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...