A patent-pending indentation method gathers data on a range of materials for which it was previously unobtainable Using Nanovea’s Mechanical Tester in indentation mode, with a cylindrical flat tip, it ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

The entire stress-strain curve can now be determined using nanoindentation with a flat-ended cylindrical punch and novel analysis of the resulting force-displacement data 1. Unlike pyramidal indenters ...

A study in Kagoshima, Japan has shown that the latest generation of TOPCon modules has surpassed p-type BC modules on energy yield during the initial month of a 1-year testing period, with an average ...