Making computer chips smaller is not just about better design. It also depends on a critical step in manufacturing called patterning, where nanoscale structures are carved into materials to form the ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Making computer chips smaller is not just about better design. It also depends on a critical step in manufacturing called patterning, where nanoscale ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...

Researchers in the United States have developed a new technique that can spot hidden ...

Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...